The ICXOM22 meeting is dedicated to the fields of micro- and nano analysis by means of X-ray beams with emphasis on synchrotron radiation sources.
The following topics will be tackled:
X-ray micro- and nanoprobe techniques:
Applications of Nano- and Microanalysis
X-ray optics, detectors and instrumentation
For the detailed programme please click here.
For the distribution of the posters please click here
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